Applications

The DIC systems from Correlated Solutions excel in every imaginable application.

Our digital image correlation (DIC) systems have been implemented successfully in a wide range of applications from automotive to biological, and size scales from microscopy to large structures. All DIC systems are sold as turnkey solutions, which are customized to your measurement needs. Our systems include all hardware, software, technical support, onsite installation, and equipment training. We are dedicated to providing our customers with quality technical support and free software upgrades for one year after the date you receive your system.

Analysis of Geometric Accuracy and Thickness Reduction in Multistage Incremental Sheet Forming using DIC

This paper describes a series of experiments in which truncated cone geometries were formed using two multistage methods and compared to the same geometry formed using the traditional single stage method. The geometric accuracy and thickness distributions, including 3D thickness distribution plots, of each are examined using digital image correlation (DIC).

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Behavior of Metals During High-Speed Dynamic Compression

Studying the behavior of metals during a high-speed dynamic compression event has always been challenging due to the complex test set up and fast data capture rates required. Currently, very little literature is available regarding deformation behavior at strain rates of 10 to 500s-1. Utilizing high-speed cameras, the VIC-3D HS system can be used to quantify the surface displacements and strains in three dimensions over the entire field with great precision. Digital image correlation (DIC) has gained widespread popularity over recent years in such high-speed applications due to its high accuracy, flexibility and ease of use.

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Microscope, VIC-3D, Electronics, Strain, Metals, Welding Brian Harmon Microscope, VIC-3D, Electronics, Strain, Metals, Welding Brian Harmon

Strains Within a 300µm Diameter Ball Solder in BGA

The VIC-3D Stereo Microscope System enables local analysis within very small elements. One industry that benefits from this small-field imaging is microelectronics. Small electronics, like ball grid arrays (BGA) seen here, are too far small for traditional DIC to provide enough resolution to obtain local strain distribution within the actual ball solder.

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NASA Buckling Test with Real Time Module

Digital Image Correlation has played a key role in the successful NASA SBKF test program. As the video footage shows, the VIC-3D system provides information that would be unimaginable with any other technology. Used in conjunction with FEA modeling, it will allow NASA to decrease weight and increase the payload of future rockets.

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