Correlated Solutions offers non-contact shape and deformation measurement solutions for materials and product testing. These measurements can be made on length scales ranging from microns to meters and time scales as small as nanoseconds. Our scientists and engineers have specialized in deformation measurements for over 20 years and are recognized as world leaders and the inventors of Digital Image Correlation. In addition to our powerful Digital Image Correlation systems, Correlated Solutions also offers a range of measurement solutions for Laser Shearography and Vibration analysis.
We have launched new training material in the form of tutorial videos. Check out our new webpage under Support -> Training... Read More →
We’re very pleased and excited to announce the launch of the new Correlated Solutions DIC Forum, where existing CSI customers... Read More →
The first International Digital Image Correlation Conference & Workshop Hosted by Correlated Solutions, Inc. will be held on September 16-18 at the... Read More →
Correlated Solutions will be exhibiting at the Space Tech Expo
in Pasadena, California, May 24-26, 2016 for the first time in our exhibiting history. We have extensive experience providing measurement solutions for NASA, SpaceX, ULA, JPL, WPAFB, Boeing, Airbus, and other major aerospace customers. Please come by booth 3032 to speak with our engineers in person about your application.
Correlated Solutions will be exhibiting at the SEM XIII
at the Rosen Plaza, in Orlando, Florida, June 6-9, 2016. Please come by our booth to speak with our Sales and Support Engineers about your existing systems and how we can improve your testing results. New customers are also highly encouraged to come by and find out how a VIC system can help you and your lab.
Correlated Solutions will be exhibiting at the Shock & Vibration Exchange
at the Sheraton New Orleans, October 17-20, 2016. Please drop in to hear our vendor presentation on ODS analysis
and come by booth 307 to speak to our engineers about your non-contact ODS measurement needs.